@Test
public void testSetTerminalConfiguration() throws IOException {
try {
controller.setTerminalConfiguration(null);
fail("Got no RuntimeException on calling 'setTerminalConfiguration(null)'!");
} catch (RuntimeException e) {
// expected
}
try {
controller.setTerminalConfiguration(
new DeviceControllerTerminalConfiguration(null, false, false, false, false));
fail(
"Got no RuntimeException on calling 'setTerminalConfiguration(tcon)' "
+ " where tcon.getChannel() is null!");
} catch (RuntimeException e) {
// expected
}
// 0b0101010101 -> TCON-bits (see 4.2.2.2)
mockReadResult(i2cDevice, (byte) 0, (byte) 0b0101010101, null);
DeviceControllerTerminalConfiguration tconA =
new DeviceControllerTerminalConfiguration(
DeviceControllerChannel.A, true, true, true, false);
controller.setTerminalConfiguration(tconA);
// reading current configuration:
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1001100);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
// The first four bits of the second byte are the same four bits of
// the mocked read-result. Those four bits represent the configuration
// of wiper1. This test only modifies wiper0, so only the last four
// bits have to be according to 'tconA'.
verify(i2cDevice).write(new byte[] {(byte) 0b1000000, (byte) 0b01011110}, 0, 2);
DeviceControllerTerminalConfiguration tconB =
new DeviceControllerTerminalConfiguration(
DeviceControllerChannel.B, false, false, false, true);
controller.setTerminalConfiguration(tconB);
// reading current configuration:
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1001100, 2);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
// The last four bits of the second byte are the same four bits of
// the mocked read-result. Those four bits represent the configuration
// of wiper0. This test only modifies wiper1, so only the last four
// bits have to be according to 'tconB'.
verify(i2cDevice).write(new byte[] {(byte) 0b1000000, (byte) 0b00010101}, 0, 2);
}
@Test
public void testSetWiperLock() throws IOException {
try {
controller.setWiperLock(null, true);
fail("Got no RuntimeException on calling 'setWiperLock(null, ...)'!");
} catch (RuntimeException e) {
// expected
}
// channel.A -> lock
controller.setWiperLock(DeviceControllerChannel.A, true);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0100100}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// channel.A -> unlock
reset(i2cDevice);
controller.setWiperLock(DeviceControllerChannel.A, false);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0101000}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// channel.B -> lock
reset(i2cDevice);
controller.setWiperLock(DeviceControllerChannel.B, true);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0110100}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// channel.B -> unlock
reset(i2cDevice);
controller.setWiperLock(DeviceControllerChannel.B, false);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0111000}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
}
@Test
public void testDecrease() throws IOException {
try {
controller.decrease(null, 1);
fail("Got no RuntimeException on calling 'decrease(null, ...)'!");
} catch (RuntimeException e) {
// expected
}
// zero-step decrease
controller.increase(DeviceControllerChannel.A, 0);
// 'write' called zero times
verify(i2cDevice, times(0)).write(any(byte[].class), anyInt(), anyInt());
// one-step decrease
reset(i2cDevice);
controller.decrease(DeviceControllerChannel.A, 1);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0001000}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// three-step decrease
reset(i2cDevice);
controller.decrease(DeviceControllerChannel.B, 3);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice)
.write(new byte[] {(byte) 0b0011000, (byte) 0b0011000, (byte) 0b0011000}, 0, 3);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// negative-steps decrease
reset(i2cDevice);
controller.decrease(DeviceControllerChannel.A, -1);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0000100}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
}
@Test
public void testSetWriteProtection() throws IOException {
// lock
controller.setWriteProtection(true);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b11110100}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// unlock
reset(i2cDevice);
controller.setWriteProtection(false);
// test for proper write-argument -> see FIGURE 7-7 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b11111000}, 0, 1);
// 'write' called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
}
@Test
public void testGetDeviceStatus() throws IOException {
// test io-exception
try {
controller.getDeviceStatus();
fail(
"Excpected IOException (but there is no) because "
+ "I2CDevice-mock is not initialized yet!");
} catch (IOException e) {
// expected
}
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1011100);
// test success
reset(i2cDevice);
final int[] length = new int[1];
// 0b1111111110101 -> Status-bits (see 4.2.2.1)
mockReadResult(i2cDevice, (byte) 0b00011111, (byte) 0b11110101, length);
DeviceControllerDeviceStatus deviceStatus1 = controller.getDeviceStatus();
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1011100);
assertTrue(
"On calling 'getDeviceStatus' the method I2CDevice.read(...)"
+ "is called with a byte-array as first argument. The length of this "
+ "array must be at least 2 but was "
+ length[0],
length[0] >= 2);
assertEquals(
"Unexpected EEPROM-write-active-flag according to "
+ "status-bits 0b1111111110101 (see 4.2.2.1)",
false,
deviceStatus1.isEepromWriteActive());
assertEquals(
"Unexpected channel-B-locked-flag according to "
+ "status-bits 0b1111111110101 (see 4.2.2.1)",
true,
deviceStatus1.isChannelBLocked());
assertEquals(
"Unexpected channel-A-locked-flag according to "
+ "status-bits 0b1111111110101 (see 4.2.2.1)",
false,
deviceStatus1.isChannelALocked());
assertEquals(
"Unexpected EEPROM-write-protected-flag according to "
+ "status-bits 0b1111111110101 (see 4.2.2.1)",
true,
deviceStatus1.isEepromWriteProtected());
reset(i2cDevice);
// 0b1111111111010 -> Status-bits (see 4.2.2.1)
mockReadResult(i2cDevice, (byte) 0b00011111, (byte) 0b11111010, length);
DeviceControllerDeviceStatus deviceStatus2 = controller.getDeviceStatus();
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1011100);
assertTrue(
"On calling 'getDeviceStatus' the method I2CDevice.read(...)"
+ "is called with a byte-array as first argument. The length of this "
+ "array must be at least 2 but was "
+ length[0],
length[0] >= 2);
assertEquals(
"Unexpected EEPROM-write-active-flag according to "
+ "status-bits 0b1111111111010 (see 4.2.2.1)",
true,
deviceStatus2.isEepromWriteActive());
assertEquals(
"Unexpected channel-B-locked-flag according to "
+ "status-bits 0b1111111111010 (see 4.2.2.1)",
false,
deviceStatus2.isChannelBLocked());
assertEquals(
"Unexpected channel-A-locked-flag according to "
+ "status-bits 0b1111111111010 (see 4.2.2.1)",
true,
deviceStatus2.isChannelALocked());
assertEquals(
"Unexpected EEPROM-write-protected-flag according to "
+ "status-bits 0b1111111111010 (see 4.2.2.1)",
false,
deviceStatus2.isEepromWriteProtected());
// test wrong answer from device
reset(i2cDevice);
// 0b0000000000000000 -> malformed result!
mockReadResult(i2cDevice, (byte) 0b00000000, (byte) 0b000000000, length);
try {
controller.getDeviceStatus();
fail(
"Excpected IOException (but there is no) because "
+ "I2CDevice-mock returns malformed device-status!");
} catch (IOException e) {
// expected
}
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1011100);
assertTrue(
"On calling 'getDeviceStatus' the method I2CDevice.read(...)"
+ "is called with a byte-array as first argument. The length of this "
+ "array must be at least 2 but was "
+ length[0],
length[0] >= 2);
}
@Test
public void testGetTerminalConfiguration() throws IOException {
try {
controller.getTerminalConfiguration(null);
fail("Got no RuntimeException on calling 'getTerminalConfiguration(null)'!");
} catch (RuntimeException e) {
// expected
}
// 0b0111000011 -> TCON-bits (see 4.2.2.2)
mockReadResult(i2cDevice, (byte) 0, (byte) 0b11000011, null);
DeviceControllerTerminalConfiguration tconA =
controller.getTerminalConfiguration(DeviceControllerChannel.A);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1001100);
assertNotNull("Calling 'getTerminalConfiguration(Channel.A)' did return null!", tconA);
assertEquals(
"Result of 'getTerminalConfiguration(Channel.A)' did not return '"
+ "Channel.A' on calling 'getChannel()'!",
DeviceControllerChannel.A,
tconA.getChannel());
assertEquals(
"According to mocked read-result the channel should be disabled!",
false,
tconA.isChannelEnabled());
assertEquals(
"According to mocked read-result the pin A should be disabled!",
false,
tconA.isPinAEnabled());
assertEquals(
"According to mocked read-result the pin W should be enabled!",
true,
tconA.isPinWEnabled());
assertEquals(
"According to mocked read-result the pin B should be enabled!",
true,
tconA.isPinBEnabled());
DeviceControllerTerminalConfiguration tconB =
controller.getTerminalConfiguration(DeviceControllerChannel.B);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b1001100, 2);
assertNotNull("Calling 'getTerminalConfiguration(Channel.B)' did return null!", tconB);
assertEquals(
"Result of 'getTerminalConfiguration(Channel.B)' did not return '"
+ "Channel.A' on calling 'getChannel()'!",
DeviceControllerChannel.B,
tconB.getChannel());
assertEquals(
"According to mocked read-result the channel should be enabled!",
true,
tconB.isChannelEnabled());
assertEquals(
"According to mocked read-result the pin A should be enabled!",
true,
tconB.isPinAEnabled());
assertEquals(
"According to mocked read-result the pin W should be disabled!",
false,
tconB.isPinWEnabled());
assertEquals(
"According to mocked read-result the pin B should be disabled!",
false,
tconB.isPinBEnabled());
}
@Test
public void testSetValue() throws IOException {
try {
controller.setValue(null, 1, true);
fail("Got no RuntimeException on calling 'setValue(null, ...)'!");
} catch (RuntimeException e) {
// expected
}
try {
controller.setValue(DeviceControllerChannel.A, -1, true);
fail("Got no RuntimeException on calling 'setValue(...)' using a negative value!");
} catch (RuntimeException e) {
// expected
}
// test wiper 0 - volatile
controller.setValue(DeviceControllerChannel.A, 0, false);
// test for proper write-argument -> see FIGURE 7-2 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0000000, (byte) 0b00000000}, 0, 2);
// test for write was called only once
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// test wiper 1 - volatile
reset(i2cDevice);
controller.setValue(DeviceControllerChannel.B, 1, false);
// test for proper write-argument -> see FIGURE 7-2 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0010000, (byte) 0b00000001}, 0, 2);
// 'write' is called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// test wiper 0 - non-volatile
reset(i2cDevice);
controller.setValue(DeviceControllerChannel.A, 255, true);
// test for proper write-argument -> see FIGURE 7-2 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0100000, (byte) 0b11111111}, 0, 2);
// 'write' is called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
// test wiper 1 - non-volatile
reset(i2cDevice);
controller.setValue(DeviceControllerChannel.B, 256, true);
// test for proper write-argument -> see FIGURE 7-2 and TABLE 4-1
verify(i2cDevice).write(new byte[] {(byte) 0b0110001, (byte) 0b00000000}, 0, 2);
// 'write' is called on time
verify(i2cDevice).write(any(byte[].class), anyInt(), anyInt());
}
@Test
public void testGetValue() throws IOException {
try {
controller.getValue(null, true);
fail("Got no RuntimeException on calling 'getValue(null, ...)'!");
} catch (RuntimeException e) {
// expected
}
// test wiper 0 - volatile
// 0b0000000000000000 -> 0
mockReadResult(i2cDevice, (byte) 0b00000000, (byte) 0b00000000, (int[]) null);
int currentValue = controller.getValue(DeviceControllerChannel.A, false);
assertEquals(
"Expected result of 'getCurrentValue(...)' as 0 " + "but got " + currentValue,
0,
currentValue);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b0001100);
// test wiper 1 - volatile
reset(i2cDevice);
// 0b0000000010000000 -> 128
mockReadResult(i2cDevice, (byte) 0b00000000, (byte) 0b10000000, (int[]) null);
currentValue = controller.getValue(DeviceControllerChannel.B, false);
assertEquals(
"Expected result of 'getCurrentValue(...)' as 128 " + "but got " + currentValue,
128,
currentValue);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b0011100);
// test wiper 0 - non-volatile
reset(i2cDevice);
// 0b0000000100000001 -> 257
mockReadResult(i2cDevice, (byte) 0b00000001, (byte) 0b00000001, (int[]) null);
currentValue = controller.getValue(DeviceControllerChannel.A, true);
assertEquals(
"Expected result of 'getCurrentValue(...)' as 257 " + "but got " + currentValue,
257,
currentValue);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b0101100);
// test wiper 1 - non-volatile
reset(i2cDevice);
// 0b0000000100000001 -> 257
mockReadResult(i2cDevice, (byte) 0b00000001, (byte) 0b00000001, (int[]) null);
currentValue = controller.getValue(DeviceControllerChannel.B, true);
assertEquals(
"Expected result of 'getCurrentValue(...)' as 257 " + "but got " + currentValue,
257,
currentValue);
// test for proper write-argument -> see FIGURE 7-5 and TABLE 4-1
testForWriteAndRead((byte) 0b0111100);
}
