/** TODO this fails, since we don't handle deletions, etc, in peek */
public void SKIP_testPeek() throws Exception {
KeyValue[] kvs =
new KeyValue[] {
KeyValueTestUtil.create("R1", "cf", "a", 1, KeyValue.Type.Put, "dont-care"),
KeyValueTestUtil.create("R1", "cf", "a", 1, KeyValue.Type.Delete, "dont-care"),
};
List<KeyValueScanner> scanners = scanFixture(kvs);
Scan scanSpec = new Scan(Bytes.toBytes("R1"));
StoreScanner scan = new StoreScanner(scanSpec, scanInfo, scanType, getCols("a"), scanners);
assertNull(scan.peek());
}
public void testScannerReseekDoesntNPE() throws Exception {
List<KeyValueScanner> scanners = scanFixture(kvs);
StoreScanner scan =
new StoreScanner(new Scan(), scanInfo, scanType, getCols("a", "d"), scanners);
// Previously a updateReaders twice in a row would cause an NPE. In test this would also
// normally cause an NPE because scan.store is null. So as long as we get through these
// two calls we are good and the bug was quashed.
scan.updateReaders();
scan.updateReaders();
scan.peek();
}
